Atomic Force Microscope for use in a Scanning Electron Microscope

SOL #: 1333ND26QNB030045Combined Synopsis/Solicitation

Overview

Buyer

Commerce
National Institute Of Standards And Technology
DEPT OF COMMERCE NIST
GAITHERSBURG, MD, 20899, United States

Place of Performance

Gaithersburg, MD

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Laboratory Equipment And Supplies (6640)

Set Aside

No set aside specified

Timeline

1
Posted
Feb 10, 2026
2
Submission Deadline
Feb 19, 2026, 10:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Please see attached combined synopsis/solicitation.

People

Points of Contact

Cielo IbarraPRIMARY

Files

Files

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Versions

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Combined Synopsis/Solicitation
Posted: Feb 10, 2026
Atomic Force Microscope for use in a Scanning Electron Microscope | GovScope