CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation

SOL #: 1333ND26QNB030236Combined Synopsis/Solicitation

Overview

Buyer

Commerce
National Institute Of Standards And Technology
DEPT OF COMMERCE NIST
GAITHERSBURG, MD, 20899, United States

Place of Performance

Gaithersburg, MD

NAICS

Other Measuring and Controlling Device Manufacturing (334519)

PSC

Laboratory Equipment And Supplies (6640)

Set Aside

No set aside specified

Timeline

1
Posted
Jun 15, 2026
2
Submission Deadline
Jun 29, 2026, 3:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

The National Institute of Standards and Technology (NIST), under the Department of Commerce, has issued a Request for Quotation (RFQ) for a Custom Diffractometry and Fourier Ptychography Endstation. This opportunity, identified as RFQ 1333ND26QNB680229, seeks to acquire specialized laboratory equipment to enhance measurement capabilities for the CHIPS R&D Metrology Program in Gaithersburg, MD. This is an unrestricted competition for a firm-fixed-price purchase order. Quotations are due by June 29, 2026, at 11:00 am Eastern Time.

Purpose & Scope

NIST's Nanoscale Device Characterization Division (NDCD) requires this custom endstation to expand its measurement capabilities using extreme-ultraviolet (EUV) light. The objective is to enable non-destructive three-dimensional measurement of nanoscale features in computer chips, directly supporting the American semiconductor industry and the CHIPS R&D Metrology Program.

The scope of work includes providing a new, custom vacuum chamber body (40"x40" interior, 24" height) capable of high vacuum (10-6 Torr base pressure), a sample stage with 4 degrees of freedom for a 300 mm Si wafer, an optical/camera stage, and a full in-vacuum EUV camera (2k x 2k or better resolution, 16-bit+). All components must be new, and experimental/prototype items are not acceptable. The contractor will also provide detailed CAD drawings for NIST approval.

Contract Details

  • Contract Type: Firm-fixed-price purchase order.
  • Line Items (CLINs):
    • CLIN 0001: Custom Diffractometry and Fourier Ptychography Endstation.
    • CLIN 0002: Optional Installation and Training.
    • CLIN 0003: Shipping.
    • CLIN 0004: Other transportation related charges (Not-to-Exceed).
  • Period of Performance: 13 months from award date (excluding warranty).
  • Delivery: Not later than 120 days after receipt of order (ARO) to NIST, Gaithersburg, MD.
  • Warranty: Minimum 1 year from acceptance.
  • Payment: 100% after installation, acceptance, and successful completion of testing and demonstration.

Submission & Evaluation

  • Submission Deadline: June 29, 2026, 11:00 am Eastern Time.
  • Submission Method: Electronic quotations via email to tracy.retterer@nist.gov and Donald.collie@nist.gov. The RFQ number must be referenced in the subject line.
  • Quotation Preparation: Must be clearly written, indexed, and logically assembled into three volumes: Technical, Price, and Terms & Conditions.
  • Pre-Quote Inquiries: Submit questions in writing to both contacts no later than 5 calendar days after the solicitation issuance date.
  • Evaluation Criteria: Award will be made to the responsible offeror who meets all required technical specifications and proposes the lowest price (Lowest Priced, Technically Acceptable - LPTA).

Eligibility & Set-Aside

  • Competition: Unrestricted competition.
  • NAICS Code: 334519 (Laboratory Equipment And Supplies) with a small business size standard of 600 employees.
  • SAM Registration: Offerors must possess an ACTIVE registration in SAM.gov at the time of quotation submission, award, performance, and final payment.

Key Attachments

Detailed requirements are provided in Attachment #1: STATEMENT OF WORK/REQUIREMENTS DOCUMENT AND DRAWINGS. Applicable provisions and clauses are listed in Attachment #2.

Contact Information

For inquiries, contact Tracy Retterer (tracy.retterer@nist.gov) or Donald Collie (donald.collie@nist.gov).

People

Points of Contact

Tracy RettererPRIMARY
Donald CollieSECONDARY

Files

Files

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Versions

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Combined Synopsis/Solicitation
Posted: Jun 15, 2026
CHIPS R&D Custom Diffractometry and Fourier Ptychography Endstation | GovScope