CHIPS R&D: Upgrade of In-Line RSoXS through station – Combined Sources Sought/Notice of Intent to Sole Source
Overview
Buyer
Place of Performance
NAICS
PSC
Set Aside
Original Source
Timeline
Qualification Details
Fit reasons
- NAICS alignment with historical contract wins in similar service areas.
- Scope strongly matches core technical capabilities and delivery model.
Risks
- Past performance thresholds may require one additional teaming partner.
- Potential clarification needed on staffing minimums before bid/no-bid.
Next steps
Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.
Quick Summary
The National Institute of Standards and Technology (NIST), Materials Measurement Lab, has issued a Combined Sources Sought Notice and Notice of Intent to Sole Source for the upgrade of the in-line Resonant Soft X-ray Scattering (RSoXS) through station at NSLS-II in Upton, NY. This effort is part of the CHIPS Metrology program. NIST intends to award a sole source contract to XDS Oxford Limited but is seeking information from other capable sources. Responses are due by February 11, 2025.
Scope of Work
NIST requires an upgrade to the RSoXS through station to enable soft X-ray reflectivity and resonant critical dimension small angle scattering (res-CDSAXS), enhancing characterization for new photolithography materials. The upgrade also includes a high-throughput sample exchange system. Key requirements for the new system include:
- Replacement of the current RSoXS station at SST1 beamline.
- Unimpeded soft X-ray beam passage when inactive.
- Maintenance of an Ultra-High Vacuum (UHV) environment (<5x10^-8 mBar).
- Stability and reproducibility of component placement to within 10 microns.
- Provision of necessary vacuum pumps, gauges, and hardware.
- UHV compatible and radiation-hardened cabling.
- Motor controllers and power supplies with software drivers matching BNL requirements.
- Protection of internal components to prevent light/electron/ion emission that could interfere with X-ray cameras.
Contract & Timeline
- Type: Combined Sources Sought / Notice of Intent to Sole Source (Special Notice)
- Set-Aside: None specified (intent to sole source)
- NAICS: 334513 (Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Physical Properties)
- Response Due: February 11, 2025, 4:00 PM ET
- Published: February 11, 2026 (Note: This published date appears to be a typo, as it is after the response date. The response date is the primary action date.)
Response Requirements
Interested parties should provide:
- Company name, address, contact information, and UEI.
- Details on capabilities meeting or exceeding NIST's minimum requirements.
- Authorization as a reseller, if applicable.
- Identification of any unduly restrictive requirements and suggestions for small business participation.
- Small business status.
- Alternative NAICS code suggestions.
- Existing Federal Supply Schedule or other contract numbers.
- Firm's experience providing similar products/services.
- Any other valuable market research information.
- Indication if further engagement or information is desired.
Additional Notes
This is a market research notice and not a request for quotation or a commitment to award a contract. NIST will use responses to inform future solicitation decisions. No award will be made from this notice, and NIST is not responsible for response costs. Questions should be submitted within 5 days of posting to the primary and secondary contacts.