CHIPS XAFS and Diffraction, Silicon Drift Detector
Overview
Buyer
Place of Performance
NAICS
PSC
Set Aside
Original Source
Timeline
Qualification Details
Fit reasons
- NAICS alignment with historical contract wins in similar service areas.
- Scope strongly matches core technical capabilities and delivery model.
Risks
- Past performance thresholds may require one additional teaming partner.
- Potential clarification needed on staffing minimums before bid/no-bid.
Next steps
Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.
Quick Summary
The Department of Commerce, National Institute of Standards and Technology (NIST) has issued an Award Notice for CHIPS XAFS and Diffraction, Silicon Drift Detector equipment. This award was made on a sole-source basis to acquire specialized laboratory instruments for NIST's Beamline for Materials Measurement (BMM) facility at Brookhaven National Laboratory in Upton, NY. The procurement aims to enhance X-ray Absorption Spectroscopy measurement capabilities for semiconductor samples.
Scope of Work
The award covers the noncompetitive purchase of two new detectors:
- One strip detector for high-resolution X-ray diffraction.
- One large-area, photo-counting X-ray detector. These detectors must meet stringent technical specifications, including photon-counting pixel capabilities with high dynamic range, specific count rates (exceeding 10^5 photons/sec/pixel for strip, 10^6 for large-area), and defined energy discrimination thresholds (4.5-40 keV for strip, 3.5-30 keV for large-area).
Contract & Timeline
- Type: Sole Source Award (Justification for Other Than Full and Open Competition)
- Estimated Value: $760,000
- Authority: 41 U.S.C. 3304(a)(1) using simplified acquisition procedures under 41 U.S.C. 1901
- Published Date: March 20, 2026
Evaluation & Justification
This was a sole-source award, not a competitive solicitation. Market research, including a sources sought notice and RFI, was conducted by NIST. No responses were received from other potential sources capable of meeting the specific technical requirements. Dectris AG was identified as the only source capable of providing the necessary detectors. A Notice of Intent to award a sole source contract was posted on SAM.gov, and no responsible sources expressed interest by the response deadline.
Place of Performance
Upton, NY, United States
Contact Information
- Primary: Tracy Retterer (Tracy.retterer@nist.gov)
- Secondary: Donald Collie (donald.collie@nist.gov, 3019756458)