Field-Emission Scanning Electron Microscope (FE‑SEM) System

SOL #: 6-B175-Q-00131-00Solicitation

Overview

Buyer

Energy
Energy, Department Of
ARGONNE NATL LAB - DOE CONTRACTOR
Lemont, IL, 60439, United States

Place of Performance

Place of performance not available

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Laboratory Equipment And Supplies (6640)

Set Aside

No set aside specified

Timeline

1
Posted
Jan 20, 2026
2
Last Updated
Jan 26, 2026
3
Submission Deadline
Jan 30, 2026, 11:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

The Department of Energy's Argonne National Laboratory is seeking proposals for a Field-Emission Scanning Electron Microscope (FE-SEM) System, including installation and testing. This acquisition aims to enhance the analytical capabilities of the NanoScience and Technology (NST) Division and update aging equipment. Proposals are due January 30, 2026, at 5:00 PM CST.

Scope of Work

The requirement is for a new FE-SEM system with specific capabilities, including:

  • Sub-nanometer spatial resolution, field emission gun, and a Wavelength Dispersive Spectrometer (WDS) detector capable of elemental detection limits down to 100ppm.
  • Integration of existing Cathodoluminescence (CL) and Energy Dispersive Spectrometer (EDS) systems into the new platform.
  • Ability to image insulating/beam-sensitive samples using deceleration mode.
  • Inclusion of retractable directional backscatter electron (DBS) and scanning transmission electron microscopy (STEM) detectors.
  • Provision of heating and cryogenic stages with controllers.
  • A strongly desired option is an Ultra-Fast Beam Blanker with a pulse width (FWHM) ≤600 ps for time-resolved capabilities.
  • The vendor is responsible for delivery, installation, testing, and a minimum 1-year warranty.
  • Removal of old microscopes (Hitachi 4700 and FEI Quanta, serial numbers D7940 and 202325001 respectively) is included.
  • Place of performance is Room DL-120 in D-wing of Building 212, Argonne National Laboratory.

Contract & Submission Details

  • Opportunity Type: Solicitation (Request for Quotation - RFQ 6-B175-Q-00131-00).
  • Set-Aside: None specified. Buy American Act considerations apply (FAR 52.225-1).
  • Contract Type: Resulting Purchase Order subject to Argonne Terms and Conditions (Appendix A).
  • Payment Terms: Net 30 days.
  • Shipping: F.O.B. Destination. Shipping insurance should not be included as Argonne is self-insured.
  • Required Submissions:
    • Signed Page 1 of the RFQ.
    • Proposal with two priced configurations: Base System (no ultra-fast beam blanker) and Base System + Optional Ultra-Fast Beam Blanker.
    • Lead Time and Shipping Origin (confirm Incoterms DAP for international, FOB Destination for domestic).
    • Country of Origin.
    • Completed ANL-70B Representations and Certifications form.
    • Acknowledge and sign Addendum 0001.
  • On-Site Work: Contractors performing on-site work must adhere to "Moderate Risk On-Site Supplemental Conditions" (ANL-366M), covering indemnity, insurance, and extensive Environment, Safety, and Health (ES&H) protocols.

Key Dates

  • Questions Due: January 26, 2026, at 12:00 PM CST.
  • Proposals Due: January 30, 2026, at 5:00 PM CST.
  • Delivery Target: Mid-June 2026.
  • Installation/Testing Completion: Within 2 months after delivery.

Contact Information

People

Points of Contact

Jenna Doria-GarnerPRIMARY

Files

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Versions

Version 3
Solicitation
Posted: Jan 26, 2026
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Solicitation
Posted: Jan 21, 2026
Version 1
Solicitation
Posted: Jan 20, 2026
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Field-Emission Scanning Electron Microscope (FE‑SEM) System | GovScope