Focused Ion Beam/Scanning Electron Microscope (FIB/SEM)
Overview
Buyer
Place of Performance
NAICS
PSC
Set Aside
Original Source
Timeline
Qualification Details
Fit reasons
- NAICS alignment with historical contract wins in similar service areas.
- Scope strongly matches core technical capabilities and delivery model.
Risks
- Past performance thresholds may require one additional teaming partner.
- Potential clarification needed on staffing minimums before bid/no-bid.
Next steps
Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.
Quick Summary
The National Institute of Standards and Technology (NIST), under the Department of Commerce, has issued an Award Notice for a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM). This notice, published on March 27, 2026, signifies the completion of an acquisition for advanced scientific equipment.
Scope of Acquisition
This acquisition pertains to a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM), which is critical equipment used for high-resolution imaging, nanoscale fabrication, and materials characterization, particularly in the field of semiconductor devices and associated hardware. The specific details of the awarded vendor or contract value are not provided in this notice.
Contract & Timeline
- Type: Award Notice
- Published Date: March 27, 2026
- Product Service Code: 5961 (Semiconductor Devices And Associated Hardware)
- Place of Performance: Maryland (MD), United States
Additional Information
For inquiries regarding this award, the primary contact is Nina Lin (nina.lin@nist.gov), and the secondary contact is Forest Crumpler (forest.crumpler@nist.gov), both from the DEPT OF COMMERCE NIST office.