Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY
SOL #: W911PT26QA041Solicitation
Overview
Buyer
DEPT OF DEFENSE
Dept Of The Army
W6QK ACC WVA
WATERVLIET, NY, 12189-4050, United States
Place of Performance
Watervliet, NY
NAICS
Electronic and Precision Equipment Repair and Maintenance (811210)
PSC
Maintenance, Repair And Rebuilding Of Equipment: Special Industry Machinery (J036)
Set Aside
No set aside specified
Original Source
Timeline
1
Posted
Feb 27, 2026
2
Submission Deadline
Mar 6, 2026, 8:00 PM
Qualification Details
Fit reasons
- NAICS alignment with historical contract wins in similar service areas.
- Scope strongly matches core technical capabilities and delivery model.
Risks
- Past performance thresholds may require one additional teaming partner.
- Potential clarification needed on staffing minimums before bid/no-bid.
Next steps
Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.
This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached.
*** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. ***
People
Points of Contact
Katja FoxPRIMARY
Files
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Versions
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Solicitation
Posted: Feb 27, 2026