Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY

SOL #: W911PT26QA041Solicitation

Overview

Buyer

DEPT OF DEFENSE
Dept Of The Army
W6QK ACC WVA
WATERVLIET, NY, 12189-4050, United States

Place of Performance

Watervliet, NY

NAICS

Electronic and Precision Equipment Repair and Maintenance (811210)

PSC

Maintenance, Repair And Rebuilding Of Equipment: Special Industry Machinery (J036)

Set Aside

No set aside specified

Timeline

1
Posted
Feb 27, 2026
2
Submission Deadline
Mar 6, 2026, 8:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

This solicitation is for the procurement of 1 LOT - Annual maintenance, support, repair and software updates to FEI Helios 600i Focused Ion Beam, (FIB) / Scanning Electron Microscope (SEM) Dual Beam per the attached Performance Work Statement (PWS) for Benet Laboratories. Wage Determination No.2015-4143 latest revision applies and is attached.

*** This is a Sole Source Procurement with FEI Company. All Responsible offerors will be considered. ***

People

Points of Contact

Katja FoxPRIMARY

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Solicitation
Posted: Feb 27, 2026
Helios 600i Focused Ion Beam Scanning Electron Microscope Annual Maintenance for Watervliet Arsenal, NY | GovScope