PD-33-0012; Scanning Electron Microscope (SEM)

SOL #: N64498-26-SIMACQ-PD-33-0012Sources Sought

Overview

Buyer

Dept Of Defense
Dept Of The Navy
NSWC PHILADELPHIA DIV
PHILADELPHIA, PA, 19112-1403, United States

Place of Performance

Philadelphia, PA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Optical Instruments, Test Equipment, Components And Accessories (6650)

Set Aside

No set aside specified

Timeline

1
Posted
Dec 11, 2025
2
Last Updated
Feb 4, 2026
3
Response Deadline
Dec 23, 2025, 11:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

The Department of the Navy, NSWC Philadelphia Division, is conducting market research via a Presolicitation (Sources Sought Notice) for the procurement of one Field Emission Scanning Electron Microscope (FESEM) system with an integrated Energy Dispersive Spectroscopy (EDS) system. This system is intended for capital improvement and capability upgrade at their Philadelphia, PA facility. The purpose is to gather information on industry capabilities for metallographic analysis and imaging. Responses are due by December 23, 2025, at 6:00 PM ET.

Purpose & Scope

This Sources Sought Notice seeks to identify qualified businesses capable of providing a new FESEM system for the Machinery Research, Logistics & Ship Integrity Department. The system must include a Schottky Emitter (SE) field emission (FE) electron gun, secondary electron (SE) and backscatter electron (BSE) detectors, and a chamber accommodating at least a 300mm wide specimen. It requires an integrated EDS system. Functional requirements include an image resolution of less than 3nm at 1kV beam current and variable pressure capabilities (10 – 150 Pa). The system should be newly manufactured, include all necessary supplies for installation and startup, and come with on-site training by a qualified vendor representative. Imaging software capable of stitching multiple images is also required.

Contract & Timeline

  • Opportunity Type: Presolicitation (Sources Sought Notice)
  • Anticipated Contract Type: Firm Fixed-Price contract via Simplified Acquisition Procedures (SAPCOM)
  • NAICS Code: 334516, “Analytical Laboratory Instrument Manufacturing”
  • Set-Aside: Open to all businesses (large and small, including HUBZone, 8(a), SDVOSB are encouraged to respond)
  • Response Due: December 23, 2025, 6:00 PM ET
  • RFP Anticipated: February 2026
  • Sources Sought Posted: December 11, 2025

Submission Requirements

Interested businesses should submit a capability statement, maximum 5 pages, via email to Jenny Tomeo (jenny.e.tomeo.civ@us.navy.mil). The statement should address the firm's technical ability/approach, capacity (including raw materials and lead time) to meet the requirements, and may cite similar performance. Respondents must identify their small business socio-economic categories if applicable.

Important Notes

This is for informational and market research purposes only and is not a Request for Proposal (RFP). Responses are not considered offers, and the government is not obligated to award a contract based on this notice. No funds are available to pay for the preparation of responses.

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Versions

Version 3
Pre-Solicitation
Posted: Feb 4, 2026
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Version 2
Pre-Solicitation
Posted: Feb 2, 2026
View
Version 1Viewing
Sources Sought
Posted: Dec 11, 2025
Field Emission Scanning Electron Microscope (FESEM) System | GovScope