Primary S-Parameter Standards for Plasma Etching Record

SOL #: 1333ND26QNB030097Combined Synopsis/Solicitation

Overview

Buyer

Commerce
National Institute Of Standards And Technology
DEPT OF COMMERCE NIST
GAITHERSBURG, MD, 20899, United States

Place of Performance

Gaithersburg, MD

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Laboratory Equipment And Supplies (6640)

Set Aside

No set aside specified

Timeline

1
Posted
Mar 9, 2026
2
Last Updated
Mar 11, 2026
3
Submission Deadline
Sep 16, 2026, 8:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

The National Institute of Standards and Technology (NIST), under the Department of Commerce, is soliciting quotations for Primary S-Parameter Standards for Plasma Etching Record, specifically mechanical drawings and physical units of DIN 7/16 Offset Shorts. This is a Combined Synopsis/Solicitation (RFQ) for commercial products, with award based on the lowest priced, technically acceptable quote. Quotations are due by March 16, 2026, at 4:00 PM ET.

Purpose & Scope

This procurement supports NIST's research project on "RF Waveform and Rapid Frequency-Comb Diagnostics for Plasma Etching," aiming to develop high-power waveform metrology for the semiconductor industry. The contractor will deliver:

  • Mechanical Drawings: Initial, intermediate (if needed), and final drafts of DIN 7/16 Offset Shorts.
  • Primary S-Parameter Standards: Seven (7) male DIN 7/16 offset shorts, manufactured to IEEE 287.1-2021 metrology grade pin connector specifications, with specific lengths (0.631 in to 15.839 in). Devices must be beadless, gold-plated, and include a removable cap.
  • Dimensional Measurements: Twenty-eight (28) specific dimensional measurements for each device, including tolerances and measurement methods.

All items must be new, shipped in original manufacturer's packaging, and are considered modified commercial off-the-shelf items. Delivery is F.O.B Destination to Boulder, CO.

Contract Details

  • Contract Type: Firm Fixed Price Purchase Order (PO).
  • NAICS Code: 334516 (Analytical Laboratory Instrument Manufacturing), with a small business size standard of 1,000 employees.
  • Set-Aside: None specified.
  • Place of Performance: Gaithersburg, MD (for the office), but delivery is to Boulder, CO.
  • Key Provisions: Incorporates various FAR and CAR clauses, including FAR 52.212-4 (Terms and Conditions – Commercial Products and Commercial Services) and FAR 52.225-2 (Buy American Certificate).

Submission & Evaluation

  • Submission Deadline: Electronic quotations must be received by 4:00 PM Eastern Time on March 16, 2026.
  • Submission Method: Email to ranae.armstrong@nist.gov and donald.collie@nist.gov, referencing the RFQ number.
  • Inquiries Deadline: Written questions must be received by March 11, 2026, via email to both contacts.
  • Evaluation Criteria: Award will be made to the lowest priced, technically acceptable quote. Technical capability will be assessed against minimum SOW requirements. The government reserves the right to award without discussions.
  • Quotation Structure: Must include Volume I (Technical Quotation), Volume II (Price Quotation), and Volume III (Terms and Conditions).
  • Eligibility: Quoters must have an ACTIVE registration in SAM.gov at the time of submission, award, performance, and final payment.

Amendments

Amendment 0001 clarified technical specifications for Line Item 0002, confirming devices "shall have" male DIN 7/16 connectors, and corrected a typo in Scope, Item 4, to "DIN 7/16 Offset Shorts."

Contacts

People

Points of Contact

Ranae M. ArmstrongPRIMARY
Donald CollieSECONDARY

Files

Files

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Versions

Version 3Viewing
Combined Synopsis/Solicitation
Posted: Mar 11, 2026
Version 2
Combined Synopsis/Solicitation
Posted: Mar 9, 2026
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Version 1
Combined Synopsis/Solicitation
Posted: Mar 9, 2026
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Primary S-Parameter Standards for Plasma Etching Record | GovScope