Scanning Electron Microscope

SOL #: FA481926Q0009Combined Synopsis/Solicitation

Overview

Buyer

DEPT OF DEFENSE
Dept Of The Air Force
FA4819 325 CONS PKP
TYNDALL AFB, FL, 32403, United States

Place of Performance

Tyndall AFB, FL

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Laboratory Equipment And Supplies (6640)

Set Aside

No set aside specified

Timeline

1
Posted
Mar 3, 2026
2
Submission Deadline
Mar 23, 2026, 6:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

The Department of the Air Force, 325 CONS PKP, located at Tyndall AFB, FL, has issued a Combined Synopsis/Solicitation for the procurement of a Scanning Electron Microscope (SEM). This opportunity seeks a commercial item for Research & Development (R&D) purposes, including user training and installation. The acquisition is conducted under full and open competition. Proposals are due by March 23, 2026, at 1300 CST.

Scope of Work

The requirement is for one (1) SEM that meets specific salient characteristics. Key technical specifications include:

  • Power: Battery backup for a minimum of eight hours.
  • Magnification: Lower bound of 50X or more, with a resolution of 10 nm or less at 0.5kV.
  • Control: All functions via a Windows PC interface with an easy-to-understand GUI; computer-assisted optics.
  • Connectivity: No network required for operation, maintenance, or repair.
  • Stage: Goniometer sample stage with tilt at all Z-positions, and a stage camera with visible spectra live-image.
  • EDS Capability: Energy-dispersive X-ray spectroscopy (EDS) for areas >60mm², operated via SEM software, and serviced by SEM manufacturer technicians.
  • Mapping: Live mapping while imaging, updating as sample is navigated; 3D mapping/reconstruction capability; EDS overlay with individual elements.
  • Service: On-site training by the manufacturer for hardware and software, a minimum 1-year warranty covering all parts and labor, and vendor capability for technicians to respond to warranty calls/repair within 20 business days.

Contract & Timeline

  • Opportunity Type: Combined Synopsis/Solicitation
  • Contract Type: Implied Firm-Fixed Price (FFP)
  • Set-Aside: Full and Open Competition
  • NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
  • Delivery: 60 days After Receipt of Order (ARO)
  • Proposals Due: March 23, 2026, 1300 CST
  • Questions Due: March 18, 2026, 1300 CST
  • Published Date: March 3, 2026

Submission & Evaluation

Offerors must submit proposals in two separate volumes:

  • Volume 1 - Price: Completed tables with proposed unit and extended pricing.
  • Volume 2 - Technical Approach: Maximum 7 pages (excluding cover/table of contents), adhering to specified formatting (8.5x11 inch, 12-point font, 1-inch margins). Offerors must provide product literature or specification sheets confirming compliance with minimum specifications. Award will be made to the responsible offeror providing the best value to the Government, considering both Price and Technical Approach, with Price being an important evaluation factor. Bidders must review all incorporated provisions and clauses, as strict compliance is required.

Contact Information

For quotes or questions, contact SSgt Nathan Koehn at nathan.koehn.4@us.af.mil or 850-283-8527.

People

Points of Contact

TSgt Lawrence ScrogginsSECONDARY

Files

Files

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Versions

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Combined Synopsis/Solicitation
Posted: Mar 3, 2026
Scanning Electron Microscope | GovScope