SEM detector (ePix EFE TPX3 detector)

SOL #: NIST-SS26-CHIPS-65Sources Sought

Overview

Buyer

Commerce
National Institute Of Standards And Technology
DEPT OF COMMERCE NIST
GAITHERSBURG, MD, 20899, United States

Place of Performance

Boulder, CO

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Laboratory Equipment And Supplies (6640)

Set Aside

No set aside specified

Timeline

1
Posted
Jan 13, 2026
2
Response Deadline
Jan 27, 2026, 5:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

The National Institute of Standards and Technology (NIST) is conducting market research (Sources Sought) to identify sources capable of providing an SEM detector (ePix EFE TPX3 detector), a manual retract mechanism, and associated installation and training. This equipment is crucial for the CHIPS project to advance measurement science for semiconductor supply chain visibility and R&D, specifically for analyzing 2D material-based electronic devices. Responses are due by January 27, 2026.

Scope of Work

NIST requires a detector for a conventional scanning electron microscope (SEM) to collect fast electron diffraction patterns from 2D material-based devices. This will complement existing SEM capabilities and develop new imaging/diffraction modes to understand device reliability. Key requirements include:

  • Advascope ePix EFE TPX3 detector: Vacuum compatible, TPX3 with extended front-end electronics, 100 mm Si sensor interface (without Aluminum top layer), AdvaBoard USB-C readout (with external trigger/clock support), heatsink with Peltier cooling and PID control, metallic enclosure for standard camera port, and custom OCB feedthrough for SEM chamber.
  • Manual detector retract mechanism: Device to move the detector off the SEM optic axis.
  • Installation and Training: Installation of the detector on the SEM and end-user training.

Contract & Timeline

  • Type: Sources Sought / Market Research
  • Agency: National Institute of Standards and Technology (NIST), Department of Commerce
  • Set-Aside: None specified
  • Response Due: January 27, 2026, 5:00 PM ET
  • Published: January 13, 2026
  • Place of Performance: Boulder, CO, United States
  • Product Service Code: 6640 - Laboratory Equipment And Supplies

Response Requirements

Interested parties should provide:

  • Company information (name, address, contact, UEI).
  • Equipment details (manufacturer, model, technical specifications, reseller status).
  • Performance capabilities, customization limits, and suggestions for improving specifications.
  • Manufacturing location (US or other) and any planned changes.
  • Small business status for NAICS 6640 (or suggested alternative NAICS).
  • Available services (installation, training, maintenance, facility renovation).
  • Standard terms and conditions (delivery, warranty, pricing).
  • Existing Federal Supply Schedule contracts.
  • Customer references.
  • Any other valuable information or requests for additional information/meetings. Proprietary information should NOT be included.

Additional Notes

This is a market research notice for planning purposes only and does not constitute a commitment to issue a solicitation or award a contract. Responses will not be considered adequate for any future solicitation. NIST reserves the right to use provided information.

People

Points of Contact

Junee JohnsonPRIMARY

Files

Files

No files attached to this opportunity

Versions

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Sources Sought
Posted: Jan 13, 2026
SEM detector (ePix EFE TPX3 detector) | GovScope