Field-Emission Scanning Electron Microscope (FE‑SEM) System

SOL #: 6-B175-Q-00131-00Solicitation

Overview

Buyer

Energy
Energy, Department Of
ARGONNE NATL LAB - DOE CONTRACTOR
Lemont, IL, 60439, United States

Place of Performance

Place of performance not available

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Laboratory Equipment And Supplies (6640)

Set Aside

No set aside specified

Timeline

1
Posted
Jan 20, 2026
2
Last Updated
Jan 26, 2026
3
Submission Deadline
Feb 6, 2026, 11:00 PM

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

Argonne National Laboratory (ANL) is soliciting proposals for a Field-Emission Scanning Electron Microscope (FE-SEM) System, including installation and testing. This acquisition aims to enhance the analytical capabilities of ANL's NanoScience and Technology (NST) Division as part of a recapitalization plan. Vendors must provide two priced configurations: a base system and a system with an optional ultra-fast beam blanker. The proposal due date is February 6, 2026.

Scope of Work

The requirement is for a new SEM with specific capabilities, including sub-nanometer spatial resolution, a field emission gun, and a Wavelength Dispersive Spectrometer (WDS) capable of elemental detection limits down to 100ppm. The system must integrate existing Cathodoluminescence (CL) and Energy Dispersive Spectrometer (EDS) systems, be capable of imaging insulating/beam-sensitive samples, and include retractable directional backscatter electron (DBS) and scanning transmission electron microscopy (STEM) detectors, along with heating and cryogenic stages. A strongly desired option is an Ultra-Fast Beam Blanker with a pulse width (FWHM) ≤600 ps for time-resolved capabilities. The vendor is responsible for delivery by mid-June 2026, installation, testing (within two months of delivery), and a minimum 1-year warranty. Removal of old microscopes (Hitachi 4700 and FEI Quanta) is also required. The place of performance is Room DL-120 in D-wing of Building 212, Argonne National Laboratory.

Key Requirements & Submission

Bidders must provide two priced configurations: one for the Base System (no ultra-fast beam blanker) and one for the Base System + Optional Ultra-Fast Beam Blanker. Proposals must include lead time, shipping origin, and Country of Origin, adhering to FAR 52.225-1 for Buy American-Supplies. Shipping is F.O.B. Destination, and Argonne is self-insured, so shipping insurance should not be included. Bidders must complete and return the ANL-70B Representations and Certifications form and acknowledge Addendum 0001. For any on-site work, contractors must comply with ANL's Moderate Risk On-Site Supplemental Conditions (ANL-366M), covering indemnity, insurance, and extensive Environment, Safety, and Health (ES&H) protocols. The resulting Purchase Order will be subject to Argonne Terms and Conditions (Appendix A).

Contract & Timeline

  • Contract Type: Solicitation (Request for Quotation)
  • Set-Aside: None specified
  • Proposal Due Date: February 6, 2026, 5:00 PM CST
  • Questions Due Date: January 26, 2026, 12:00 PM CST
  • Delivery Target: Mid-June 2026
  • Payment Terms: Net 30 days

Contact Information

For inquiries, contact Jenna Doria-Garner at jdoria@anl.gov or (630) 252-6988.

People

Points of Contact

Jenna Doria-GarnerPRIMARY

Files

Files

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Versions

Version 3Viewing
Solicitation
Posted: Jan 26, 2026
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Posted: Jan 21, 2026
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Solicitation
Posted: Jan 20, 2026
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Field-Emission Scanning Electron Microscope (FE‑SEM) System | GovScope