Field Emission Scanning Electron Microscope (FESEM) System

SOL #: N64498-26-SIMACQ-PD-33-0012Award Notice

Overview

Buyer

Dept Of Defense
Dept Of The Navy
NSWC PHILADELPHIA DIV
PHILADELPHIA, PA, 19112-1403, United States

Place of Performance

Philadelphia, PA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

Optical Instruments, Test Equipment, Components And Accessories (6650)

Set Aside

No set aside specified

Timeline

1
Posted
Dec 11, 2025
2
Last Updated
Jun 4, 2026

Qualification Details

Fit reasons
  • NAICS alignment with historical contract wins in similar service areas.
  • Scope strongly matches core technical capabilities and delivery model.
Risks
  • Past performance thresholds may require one additional teaming partner.
  • Potential clarification needed on staffing minimums before bid/no-bid.
Next steps

Validate eligibility requirements, assign capture owner, and schedule partner outreach to confirm teaming strategy before submission planning.

Quick Summary

The Department of the Navy's Naval Surface Warfare Center, Philadelphia Division (NSWCPD) is conducting market research through a Sources Sought Notice for the procurement of one (1) new Field Emission Scanning Electron Microscope (FESEM) system with an integrated energy dispersive spectroscopy (EDS) system. This system is intended for capital improvement and metallographic analysis capabilities at the NSWC in Philadelphia, PA. The government anticipates a Firm Fixed-Price contract via Simplified Acquisition Procedures (SAPCOM). Responses are due December 23, 2025, by 6pm ET.

Scope of Work

NSWCPD seeks information on industry capabilities to provide a FESEM system with the following key features and requirements:

  • SEM Features: Schottky Emitter (SE) field emission (FE) electron gun, secondary electron (SE) and backscatter electron (BSE) detectors, and a chamber accommodating at least a 300mm wide specimen.
  • Integrated EDS System: The FESEM must include an integrated energy dispersive spectroscopy (EDS) system.
  • General Requirements: The unit must be newly manufactured and include all necessary supplies for installation and startup, along with on-site training by a qualified vendor representative.
  • Functional Requirements: Image resolution of less than 3nm at 1kV beam current and variable pressure capabilities (10 – 150 Pa).
  • Software Requirements: Imaging software capable of stitching multiple images.

Contract & Timeline

  • Type: Sources Sought (Anticipated Firm Fixed-Price via SAPCOM)
  • NAICS Code: 334516, "Analytical Laboratory Instrument Manufacturing"
  • RFP Anticipated: February 2026
  • Response Due: December 23, 2025, by 6pm ET
  • Published: December 11, 2025
  • Set-Aside: None specified (market research stage, seeking small business capabilities)

Submission & Evaluation

  • Submission Method: E-mail to Jenny Tomeo (jenny.e.tomeo.civ@us.navy.mil).
  • Capability Statement: Maximum 5 pages, addressing technical ability/approach and capacity (raw materials, lead time) to meet requirements. May cite similar performance.
  • Evaluation: Responses will be used for informational purposes to determine potential small business participation and overall industry capability.

Additional Notes

This is a Sources Sought Notice for informational purposes only and is NOT a Request for Proposal (RFP). Responses are not offers, and the government is not obligated to award a contract. No funds are available to pay for response preparation. Interested large or small businesses (including HUBZone, 8(a), SDVOSB) are requested to respond and identify their small business socio-economic categories.

People

Points of Contact

Stefan KitzingerPRIMARY

Files

Files

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Versions

Version 4Viewing
Award Notice
Posted: Jun 4, 2026
Version 3
Pre-Solicitation
Posted: Feb 4, 2026
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Version 2
Pre-Solicitation
Posted: Feb 2, 2026
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Version 1
Sources Sought
Posted: Dec 11, 2025
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Field Emission Scanning Electron Microscope (FESEM) System | GovScope